Accelerate Your Data-Intensive Applications with HPE Server Read Intensive (RI) Solid State Drives (SSDs) Are you looking to boost the performance of your data-intensive applications? Look no further than HPE Server Read Intensive (RI) Solid State Drives (SSDs). These high-performance drives offer exceptional endurance and reduced power consumption, making them the perfect choice for applications that require high random read and write IOPs performance. High Performance and Endurance for Demanding Workloads HPE Server RI SSDs are designed to deliver the highest performance for read-intensive applications, with an endurance of less than one drive write per day. This makes them ideal for Big Data Analytics, Cloud Computing, Active Archiving, Database Applications, and Data Warehousing. Reliable and Efficient for Faster Business Results With HPE Server RI SSDs, you can achieve higher Input/Output per Second (IOPs) to enhance the performance of your data center. These drives also feature full data-path error detection, ensuring data accuracy and reliability. Plus, with a broad portfolio of optimized solutions in capacities up to 1.6 TB and growing, you can find the perfect fit for your specific needs. Advanced Features for Data Protection and Management HPE integrated firmware protects your data from malicious attacks that could change or destroy it. The self-describing icons on the HPE SMART Carrier make it easy to monitor the status of your drive, and a do not remove button prevents data loss from human error. You can also track the lifespan of your SSD with HPE SmartSSD Wear Gauge compatibility in management tools. Choose from a Variety of Interfaces and Form Factors HPE Server RI SSDs are available in 12 GB SAS, 6 GB SATA, NVMe, M.2, and M.2 Enablement Kits, giving you the flexibility to choose the interface and form factor that best suits your needs. With over 3.35 million hours of rigorous testing and qualification, you can trust that these drives will deliver reliable, high-performing results for your business.
